SUMMARY
The exoemission properties of multi-layered Cu/Ni systems are presented. Samples were tested using emission of low-energetistic electrons. Furthermore, the x-ray diffraction analysis was made to determine the quality of the multi-layer structure. The x-ray diffraction spectra for systems before heat treatment showed the presence of satellite peaks. Heating of samples up to 933 K induced some distortion of their structure. Investigation of electron emission resulted in determining the temperature dependence of the emission intensity, with characteristic two maxima peaks. Heat treatment of samples provokes the growth of nanocrystalline clusters, the formation of interfacial boundaries as well as pronouncement of transport phenomena. To obtain full information about emission of electrons, the surface topography of Cu/Ni superlattices was investigated. Until now electron emission phenomenon was used as a method of complex investigations of crystalline phase properties. The aim of this paper is to demonstrate, that the electron emission method is a valuable tool to investigate the nanocrystalline
multi-layer structures..
Keywords
Low-energetistic electrons emission method, multi-layered structure, X-ray diffraction analysis.
1 Politechnika Częstochowska
