REVEAL OF THIN LAYERS AND COATINGS STRUCTURES IN METALLOGRAPHICAL INVESTIGATIONS BY USING KULOTESTER

SUMMARY
In typical metalography investigations there are three methods used: metalographical cross-section, skew
metalographic section and spherical metalographic section. Generally the layer thickness is evaluated in metalography
analysis by observation and measure of the layer reveal on metalographical cross-section. A structure
characterization with optical microscope of thin layers within the range of thickness from 0,1 µm to 5 µm could
be very uncertain. The errors come from microscope resolution and quality of preparation of microsection. Much
more precise technique is a method of skew metalography section as we can widely see the investigated area
on the sample. But, the skew metalography section method is more labour-consuming, and there is necessity to
use special metalography mounting. The easiest method, which allows to measure a thickness and analyze
structure of thin layers is spherical metalography method.

Keywords
Kalotest, metallographic investigation, layers and coatings, spherical section.

¹ Instytut Mechaniki Precyzyjnej, Warszawa